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<title>Casper, Thorben</title>
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<h2>2019</h2>
<!--Merkel_2019af-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/merkel.en.jsp">Merkel, Melina</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Bontinck, Zeger</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Corno, Jacopo</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2019):
<em>Convergence and Stability of Harmonic Stator-Rotor Coupling for the Simulation of Rotating Electric Machines using Isogeometric Analysis.</em>
In: <em>Seminar</em>, Muroran, Japan.
[Talk]</p>
<!--Krimm_2019aa-->
<p style="margin-bottom: 0.2em"><strong>Krimm, Alexander ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert ; Chamoin, Ludovic</strong>
(2019):
<em>Proper Generalized Decomposition of Parameterized Electrothermal Problems Discretized by the Finite Integration Technique.</em>
In: <span class="bibtex-protected">IEEE</span> Transactions on Magnetics, 55, (6), pp. 7204404, ISSN: 0018-9464, DOI: <a class="link" target="_top" href="https://doi.org/10.1109/TMAG.2019.2907223">10.1109/TMAG.2019.2907223</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1812.06867">1812.06867</a>.
[Article]</p>
<!--Hirmer_2019ac-->
<p style="margin-bottom: 0.2em"><strong>Hirmer, Katrin Hofmann, Klaus ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2019):
<em><span class="bibtex-protected">3D</span> Field Simulation Model for Bond Wire On-Chip Inductors Validated by Measurements.</em>
In: <em>Proceedings of the 2019 Kleinheubach Conference</em>, 1–4. IEEE.
ISBN: 978-3-948571-00-9, URL: <a class="link" target="_top" href="https://ieeexplore.ieee.org/document/8890092">https://ieeexplore.ieee.org/document/8890092</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1910.06831">1910.06831</a>.
[In Proceedings]</p>
<!--Hirmer_2019ab-->
<p style="margin-bottom: 0.2em"><strong>Hirmer, Katrin ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; Hofmann, Klaus</strong>
(2019):
<em>3D Field Simulation Model for Bond Wire On-Chip Inductors Validated by Measurements.</em>
In: <em><span class="bibtex-protected">URSI</span> Kleinheubacher Tagung (<span class="bibtex-protected">KHB</span> 2019)</em>, Miltenberg.
URL: <a class="link" target="_top" href="https://www.kh2019.de">https://www.kh2019.de</a>.
[Talk]</p>
<!--Duque_2019aa-->
<p style="margin-bottom: 0.2em"><strong>Duque, David José ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; Gillon, Renaud ; Wieers, Aarnout ; Kratochvíl, Tomáš ; Götthans, Tomáš ; Meuris, Peter</strong>
(2019):
Bond Wire Models.
In <em>Nanoelectronic Coupled Problems Solutions</em>, volume 29 of Mathematics in Industry, chapter 3, pages 46–68.
Springer, 2019.
[In Collection]</p>
<!--Casper_2019ae-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; Duque, David José ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2019):
Automated Generation of Netlists from Electrothermal Field Models.
In <em>Nanoelectronic Coupled Problems Solutions</em>, volume 29 of Mathematics in Industry, chapter 5, pages 93–113.
Springer, 2019.
[In Collection]</p>
<!--Casper_2019ad-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; Hirmer, Katrin ; Hofmann, Klaus ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2019):
<em>Field Simulation Models for the Design of Bond Wire On-Chip Inductors.</em>
In: <em>Workshop on Advances in Electromagnetic Research – <span class="bibtex-protected">KWT</span> 2019</em>, Riezlern, Austria.
URL: <a class="link" target="_top" href="http://maxwell-in-motion.org">http://maxwell-in-motion.org</a>.
[Poster]</p>
<!--Casper_2019ab-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a></strong>
(2019):
Electrothermal Field and Circuit Simulation of Thin Wires and Evaluation of Failure Probabilities.
Technische Universität Darmstadt, Darmstadt.
URN: <a class="link" target="_top" href="http://nbn-resolving.de/urn:nbn:de:tuda-tuprints-89599">urn:nbn:de:tuda-tuprints-89599</a>.
[Dissertation]</p>
<!--Casper_2019aa-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Duque, David</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2019):
<em>Automated Netlist Generation for <span class="bibtex-protected">3D</span> Electrothermal and Electromagnetic Field Problems.</em>
In: Journal of Computational Electronics, 18, (4), pp. 1306–1332, ISSN: 1569-8025, DOI: <a class="link" target="_top" href="https://doi.org/10.1007/s10825-019-01368-6">10.1007/s10825-019-01368-6</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1809.08588">1809.08588</a>.
[Article]</p>
<!--Casper_2018ah-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; De Gersem, Herbert ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2019):
<em>Coupled Simulation of Transient Heat Flow and Electric Currents in Thin Wires: Application to Bond Wires in Microelectronic Chip Packaging.</em>
In: Computers and Mathematics with Applications, ISSN: 0898-1221, DOI: <a class="link" target="_top" href="https://doi.org/10.1016/j.camwa.2019.10.009">10.1016/j.camwa.2019.10.009</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1809.09034">1809.09034</a>.
[Article]</p>
<h2>2018</h2>
<!--Merkel_2018ae-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/merkel.en.jsp">Merkel, Melina</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Bontinck, Zeger</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Corno, Jacopo</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2018):
<em>Simulation of Rotating Electric Machines Using Isogeometric Analysis with Harmonic Stator-Rotor Coupling.</em>
In: <em>Seminar</em>, Graz, Austria.
[Talk]</p>
<!--Merkel_2018ad-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/merkel.en.jsp">Merkel, Melina</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Bontinck, Zeger</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Corno, Jacopo</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2018):
<em>Harmonic Stator-rotor Coupling for The Simulation of Electrical Machines Using Isogeometric Analysis.</em>
In: <em>18th Biennial <span class="bibtex-protected">IEEE</span> Conference on Electromagnetic Field Computation (<span class="bibtex-protected">CEFC</span> 2018)</em>, Hangzhou, China.
URL: <a class="link" target="_top" href="http://www.cefc2018.org">http://www.cefc2018.org</a>.
[Poster]</p>
<!--Loukrezis_2018aa-->
<p style="margin-bottom: 0.2em"><strong>Loukrezis, Dimitrios ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2018):
<em>High Dimensional Uncertainty Quantification for an Electrothermal Field Problem using Stochastic Collocation on Sparse Grids and Tensor Train Decomposition.</em>
In: International Journal of Numerical Modelling: Electronic Networks, Devices and Fields, 31, (2), pp. e2222, ISSN: 0894-3370, DOI: <a class="link" target="_top" href="https://doi.org/10.1002/jnm.2222">10.1002/jnm.2222</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1610.03863">1610.03863</a>.
[Article]</p>
<!--Casper_2018af-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Duque, David</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2018):
<em>Electric Circuits for Exact Representations of Spatially Discretised Electrothermal and Electromagnetic <span class="bibtex-protected">3D</span> Field Problems.</em>
In: <em>Workshop on Advances in Electromagnetic Research – <span class="bibtex-protected">KWT</span> 2018</em>, Riezlern, Austria.
URL: <a class="link" target="_top" href="http://maxwell-in-motion.org">http://maxwell-in-motion.org</a>.
[Poster]</p>
<!--Bigalke_2018ab-->
<p style="margin-bottom: 0.2em"><strong>Bigalke, Steve ; Lienig, Jens ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>. <strong>Gola, Alberto</strong> <strong>(editor)</strong>
(2018):
<em>Increasing <span class="bibtex-protected">EM</span> Robustness of Placement and Routing Solutions based on Layout-Driven Discretization.</em>
In: <em>14th Conference on Ph.D. Research in Microelectronics and Electronics (<span class="bibtex-protected">PRIME</span> 2018)</em>. IEEE.
ISBN: 978-1-5386-5386-9, DOI: <a class="link" target="_top" href="https://doi.org/10.1109/PRIME.2018.8430323">10.1109/PRIME.2018.8430323</a>.
[In Proceedings]</p>
<h2>2017</h2>
<!--Romer_2017af-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2017):
<em>Uncertainty Quantification for a Singular Electrothermal Coupled Problem with Error Control.</em>
In: <em><span class="bibtex-protected">UNCECOMP</span> 2017</em>, Rhodes Island, Greece.
URL: <a class="link" target="_top" href="https://2017.uncecomp.org">https://2017.uncecomp.org</a>.
[Talk]</p>
<!--Casper_2017ai-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2017):
<em>On the Simulation of Thin Wires in a Coupled 1D-3D Setting.</em>
In: <em>4th International Conference on Computational Engineering (<span class="bibtex-protected">ICCE</span> 2017)</em>, Darmstadt, Germany.
[Talk]</p>
<!--Casper_2017ah-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2017):
<em>Determining Bond Wire Temperatures in Electronic Devices by a 1D-3D Coupling Approach.</em>
In: <em><span class="bibtex-protected">URSI</span> Kleinheubacher Tagung (<span class="bibtex-protected">KHB</span> 2017)</em>, Miltenberg.
URL: <a class="link" target="_top" href="https://www.kh2017.de">https://www.kh2017.de</a>.
[Talk]</p>
<!--Casper_2017af-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2017):
<em>1D-3D Coupling to Include Thin Wires in Electrothermal Simulations Using <span class="bibtex-protected">FIT</span>.</em>
In: <em>Workshop on Advances in Electromagnetic Research – <span class="bibtex-protected">KWT</span> 2017</em>, Riezlern, Austria.
URL: <a class="link" target="_top" href="http://maxwell-in-motion.org">http://maxwell-in-motion.org</a>.
[Talk]</p>
<!--Casper_2017ac-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2017):
<em>An Electrothermal 1D-3D Coupling Approach for Thin Wires in Microelectronic Chip Packages.</em>
In: <em>21st Conference on the Computation of Electromagnetic Fields (<span class="bibtex-protected">COMPUMAG</span> 2017)</em>, Daejeon, Korea. International Compumag Society.
URL: <a class="link" target="_top" href="http://compumag2017.com">http://compumag2017.com</a>.
[Poster]</p>
<h2>2016</h2>
<!--ter-Maten_2016ab-->
<p style="margin-bottom: 0.2em"><strong>ter Maten, E. Jan W. ; Putek, Piotr A. ; Günther, Michael ; Pulch, Roland ; Tischendorf, Caren ; Strohm, Christian ; Schoenmaker, Wim ; Meuris, Peter ; De Smedt, Bart ; Benner, Peter ; Feng, Lihong ; Banagaaya, Nicodemus ; Yue, Yao ; Janssen, Rick ; Dohmen, Jos J. ; Tasic, Bratislav ; Deleu, Frederik ; Gillon, Renaud ; Wieers, Renaud ; Brachtendorf, Hans Georg ; Bittner, Kai ; Kratochvíl, Tomás ; Petrzela, Jirí ; Sotner, Roman ; Göthans, Tomás ; Drínovský, Jirí ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; Duque, David José ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; De Gersem, Herbert ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; Reynier, Pascal ; Barroul, Patrice ; Masliah, Denis ; Rousseau, Benoît</strong>
(2016):
<em><span class="bibtex-protected">Nanoelectronic</span> <span class="bibtex-protected">COupled</span> <span class="bibtex-protected">Problems</span> <span class="bibtex-protected">Solutions</span> - <span class="bibtex-protected">nanoCOPS</span>: Modelling, Multirate, Model Order Reduction, Uncertainty Quantification, Fast Fault Simulation.</em>
In: Journal of Mathematics in Industry, ISSN: 2190-5983, DOI: <a class="link" target="_top" href="https://doi.org/10.1186/s13362-016-0025-5">10.1186/s13362-016-0025-5</a>.
[Article]</p>
<!--Schoenmaker_2016aa-->
<p style="margin-bottom: 0.2em"><strong>Schoenmaker, Wim ; De Smedt, Bart ; Strohm, Christian ; Tischendorf, Caren ; Bittner, Kai ; Brachtendorf, Hans Georg ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2016):
<em>Simulation methods for coupled problems.</em>
nanoCOPS FP7-ICT-2013-11/619166, D1.8.
[Report].</p>
<!--Loukrezis_2016ac-->
<p style="margin-bottom: 0.2em"><strong>Loukrezis, Dimitrios ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2016):
<em>Application of High Dimensional Uncertainty Quantification Methods to Electrothermal Field Problems.</em>
In: <em>10th International Symposium on Electric and Magnetic Fields (<span class="bibtex-protected">EMF</span> 2016)</em>, Lyon, France.
URL: <a class="link" target="_top" href="http://www.aimontefiore.org/emf2016/">http://www.aimontefiore.org/emf2016/</a>.
[Talk]</p>
<!--Duque_2016ag-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Duque, David</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2016):
<em>A Circuit-Based Approach for the Solution of Electrothermal and Electromagnetic Problems.</em>
In: <em><span class="bibtex-protected">URSI</span> Kleinheubacher Tagung (<span class="bibtex-protected">KHB</span> 2016)</em>, Miltenberg.
URL: <a class="link" target="_top" href="https://www.kh2016.de">https://www.kh2016.de</a>.
[Talk]</p>
<!--Casper_2016ao-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2016):
<em>Extraction of Equivalent Circuit Descriptions for Nonlinear Electrothermal Field Problems Based on <span class="bibtex-protected">FIT</span>.</em>
In: <em>Workshop on Advances in Electromagnetic Research – <span class="bibtex-protected">KWT</span> 2016</em>, Riezlern, Austria.
URL: <a class="link" target="_top" href="http://maxwell-in-motion.org">http://maxwell-in-motion.org</a>.
[Talk]</p>
<!--Casper_2016ak-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Duque, David</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2016):
<em>Equivalent Netlist Extraction for Electrothermal and Electromagnetic Problems Discretized by the Finite Integration Technique.</em>
In: <em>11th Conference on Scientific Computing in Electrical Engineering (<span class="bibtex-protected">SCEE</span> 2016)</em>, St. Wolfgang, Austria.
URL: <a class="link" target="_top" href="http://www.ricam.oeaw.ac.at/events/conferences/scee2016">http://www.ricam.oeaw.ac.at/events/conferences/scee2016</a>.
[Talk]</p>
<!--Casper_2016ai-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2016):
<em>Determination of Bond Wire Failure Probabilities in Microelectronic Packages.</em>
In: <em><span class="bibtex-protected">THERMINIC</span> 2016</em>, Budapest, Hungary.
URL: <a class="link" target="_top" href="http://www.therminic2016.eu">http://www.therminic2016.eu</a>.
[Talk]</p>
<!--Casper_2016ah-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2016):
<em>Determination of Bond Wire Failure Probabilities in Microelectronic Packages.</em>
In: <em>22nd International Workshop on Thermal Investigations of <span class="bibtex-protected">ICs</span> and Systems (<span class="bibtex-protected">THERMINIC</span> 2016)</em>, 39–44. IEEE.
ISBN: 978-1-5090-5450-3, DOI: <a class="link" target="_top" href="https://doi.org/10.1109/THERMINIC.2016.7748645">10.1109/THERMINIC.2016.7748645</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1609.06187">1609.06187</a>.
[In Proceedings]</p>
<!--Casper_2016af-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; De Gersem, Herbert ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2016):
<em>Automatic Generation of Equivalent Electrothermal <span class="bibtex-protected">SPICE</span> Netlists from 3D Electrothermal Field Models.</em>
In: <em>17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (<span class="bibtex-protected">EuroSimE</span> 2016)</em>, Montpellier, France.
[Talk]</p>
<!--Casper_2016ae-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2016):
<em>Efficient Evaluation of Bond Wire Fusing Probabilities.</em>
In: <em><span class="bibtex-protected">SIAM</span> Conference on Uncertainty Quantification 2016</em>, Lausanne.
URL: <a class="link" target="_top" href="https://www.siam.org/meetings/uq16/">https://www.siam.org/meetings/uq16/</a>.
[Talk]</p>
<!--Casper_2016ac-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; De Gersem, Herbert ; Götthans, Tomáš ; Schoenmaker, Wim ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; Wieers, Aarnout</strong>
(2016):
<em>Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries.</em>
In: <em><span class="bibtex-protected">DATE</span> 2016</em>, Dresden.
[Talk]</p>
<!--Casper_2016ab-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; De Gersem, Herbert ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>. <strong>van Driel, Willem ; Rodgers, Peter</strong> <strong>(editors)</strong>
(2016):
<em>Automatic Generation of Equivalent Electrothermal <span class="bibtex-protected">SPICE</span> Netlists from <span class="bibtex-protected">3D</span> Electrothermal Field Models.</em>
In: <em>17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (<span class="bibtex-protected">EuroSimE</span> 2016)</em>. IEEE.
ISBN: 9781509021079, DOI: <a class="link" target="_top" href="https://doi.org/10.1109/EuroSimE.2016.7463329">10.1109/EuroSimE.2016.7463329</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1610.04304">1610.04304</a>.
[In Proceedings]</p>
<!--Casper_2016aa-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; De Gersem, Herbert ; Gillon, Renaud ; Götthans, Tomáš ; Kratochvíl, Tomáš ; Meuris, Peter ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a></strong>
(2016):
<em>Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries.</em>
In: <em>Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (<span class="bibtex-protected">DATE</span>)</em>, 1297–1302. IEEE.
ISBN: 978-3-9815370-6-2, URL: <a class="link" target="_top" href="http://www.date-conference.com">http://www.date-conference.com</a>, ARXIV: <a class="link" target="_top" href="https://arxiv.org/abs/1610.04303">1610.04303</a>.
[In Proceedings]</p>
<h2>2015</h2>
<!--Romer_2015aa-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Römer, Ulrich</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; Pulch, Roland ; ter Maten, E. Jan W.</strong>
(2015):
<em>Algorithm for computation of failure probabilities and ageing effects.</em>
nanoCOPS FP7-ICT-2013-11/619166, D2.6.
[Report].</p>
<!--Casper_2015af-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2015):
<em>Multiphysical Simulation of Bonding Wires under Uncertainties.</em>
In: <em>Workshop on Advances in Electromagnetic Research – <span class="bibtex-protected">KWT</span> 2015</em>, Riezlern, Austria.
URL: <a class="link" target="_top" href="http://maxwell-in-motion.org">http://maxwell-in-motion.org</a>.
[Talk]</p>
<!--Casper_2015ad-->
<p style="margin-bottom: 0.2em"><strong><a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/former_group/">Casper, Thorben</a> ; <a class="link" target="_top" href="https://www.cem.tu-darmstadt.de/cem/group/schops.en.jsp">Schöps, Sebastian</a> ; De Gersem, Herbert</strong>
(2015):
<em>Electrothermal co-simulation of device structures in electronics.</em>
In: <em><span class="bibtex-protected">YIC</span> <span class="bibtex-protected">GACM</span> 2015 – 3rd <span class="bibtex-protected">ECCOMAS</span> Young Investigators Conference</em>, Aachen.
[Talk]</p>
</div>
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